Frustration in the Si(111) ‘‘pseudo 5×5’’ Cu structure directly observed by scanning tunneling microscopy
- 28 January 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 66 (4) , 461-464
- https://doi.org/10.1103/physrevlett.66.461
Abstract
Frustration in a surface structure has been observed in real space and time using the scanning tunneling microscope. The frustration is revealed as an instability of an inherent feature in the Si(111) ‘‘pseudo 5×5’’ Cu structure. A possible origin of the frustration is proposed.Keywords
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