Signal‐to‐noise measurement in X‐ray photoelectron spectroscopy
- 1 October 1985
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 7 (5) , 217-222
- https://doi.org/10.1002/sia.740070504
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Deconvolution in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1984
- Detection sensitivity for surface atoms in X-ray photoelectron spectroscopy and X-ray-induced Auger electron spectroscopyApplications of Surface Science, 1982
- The application of deconvolution methods in electron spectroscopy — a reviewJournal of Electron Spectroscopy and Related Phenomena, 1979
- Deconvolution and smoothing: Applications in ESCAJournal of Electron Spectroscopy and Related Phenomena, 1975