Temperature Control System for Small Angle X-Ray Scattering Experiments
- 1 November 1968
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (11) , 1701-1704
- https://doi.org/10.1063/1.1683207
Abstract
A temperature control and measurement system is described in which it has been possible to obtain temperature stability of ±0.003 C° for periods of weeks over the temperature range from 75 to 200°C. The constant temperature cell was designed to fit between the crystals of a Hart‐Bonse type, small angle diffractometer. With minor modifications it can be used with a wide range of instruments.Keywords
This publication has 3 references indexed in Scilit:
- High-Temperature Sample Cell for the Kratky Small-Angle X-Ray CameraReview of Scientific Instruments, 1967
- Small angle X-ray scattering by spherical particles of Polystyrene and PolyvinyltolueneThe European Physical Journal A, 1966
- Sorption Studies Using Automation and ComputationIndustrial & Engineering Chemistry Fundamentals, 1963