Scanning tunnelling microscopy: application to field electron emission studies
- 1 January 1999
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 32 (7) , 815-819
- https://doi.org/10.1088/0022-3727/32/7/010
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Image charge method for electrostatic calculations in field-emission diodesJournal of Applied Physics, 1996
- D.c. arc plasma deposition of smooth nanocrystalline diamond filmsDiamond and Related Materials, 1995
- The nature of field emission sitesJournal of Physics D: Applied Physics, 1975