A Study of the Surface Texture of Polycrystalline Phosphor Films Using Atomic Force Microscopy
- 1 January 1994
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Surface roughness analysis by scanning tunneling microscopy and atomic force microscopyJournal of Vacuum Science & Technology A, 1992
- Computational model of the imaging process in scanning-x microscopyPublished by SPIE-Intl Soc Optical Eng ,1991