Study of the Anodization of Niobium and Tantalum Superimposed Layers by 18O Tracing Techniques and Nuclear Microanalysis: I . 18O and Cation Depth Profiles
- 1 June 1983
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 130 (6) , 1260-1267
- https://doi.org/10.1149/1.2119936
Abstract
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