White-light speckle photography for measuring deformation, strain, and shape
- 31 October 1975
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 7 (5) , 217-221
- https://doi.org/10.1016/0030-3992(75)90042-0
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A High Sensitivity Moire Grid Technique for Studying Deformation in Large ObjectsOptical Engineering, 1975
- Displacement Measurement from Double-exposure Laser PhotographsOptica Acta: International Journal of Optics, 1972
- Multiple-Wavelength and Multiple-Source Holography Applied to Contour Generation*Journal of the Optical Society of America, 1967