In situstudies of morphology, strain, and growth modes of a molecular organic thin film

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Abstract
We use grazing incidence x-ray scattering to study the molecular structure and morphology of thin (2 ML, and the lattice strain decreases rapidly with increasing thickness. We also show that the transition between the NEQ and EQ regimes is sharp and depends upon the balance between the growth rate and substrate temperature. These results suggest that the PTCDA/Au(111) system is thermodynamically described by incomplete wetting, and that strain and kinetics play an important role in determining molecular organic film characteristics.