Defect structures in doped CeO2 studied by using XAFS spectrometry
- 30 November 2000
- journal article
- Published by Elsevier in Solid State Ionics
- Vol. 136-137, 913-920
- https://doi.org/10.1016/s0167-2738(00)00569-5
Abstract
No abstract availableKeywords
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