Step height measurement using two-wavelength phase-shifting interferometry
- 15 July 1987
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 26 (14) , 2810-2816
- https://doi.org/10.1364/ao.26.002810
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 6 references indexed in Scilit:
- Contouring Aspheric Surfaces Using Two-wavelength Phase-shifting InterferometryOptica Acta: International Journal of Optics, 1985
- Vibration-observation techniques for digital speckle-pattern interferometryJournal of the Optical Society of America A, 1985
- Measurement of surface topography of magnetic tapes by Mirau interferometryApplied Optics, 1985
- Multiple-wavelength phase-shifting interferometryApplied Optics, 1985
- Two-wavelength phase shifting interferometryApplied Optics, 1984
- Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et MesuresMetrologia, 1966