Quantitative Analysis of Stacking Faults in the Structure of SiC by X-Ray Powder Profile Refinement Method
- 1 January 1988
- journal article
- Published by Ceramic Society of Japan in Journal of the Ceramic Society of Japan
- Vol. 96 (1118) , 1003-1011
- https://doi.org/10.2109/jcersj.96.1003
Abstract
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