Artefacts in AFM studies of membranes: correcting pore images using fast fourier transform filtering
- 15 June 2000
- journal article
- Published by Elsevier in Journal of Membrane Science
- Vol. 171 (1) , 141-147
- https://doi.org/10.1016/s0376-7388(00)00297-0
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Characterisation of nanofiltration membranes for predictive purposes — use of salts, uncharged solutes and atomic force microscopyJournal of Membrane Science, 1997
- Atomic force microscope studies of membranes: Surface pore structures of Cyclopore and Anopore membranesJournal of Membrane Science, 1996
- Visualisation of an ultrafiltration membrane by non-contact atomic force microscopy at single pore resolutionJournal of Membrane Science, 1996
- Surface morphology of homogeneous and asymmetric membranes made from poly(phenylene oxide) by tapping mode atomic force microscopeJournal of Applied Polymer Science, 1996
- Investigations of surface properties of polymeric membranes by near field microscopyJournal of Membrane Science, 1996
- The structure and morphology of the skin of polyethersulfone ultrafiltration membranes: A comparative atomic force microscope and scanning electron microscope studyJournal of Applied Polymer Science, 1992
- Atomic force microscopy for high-resolution imaging in cell biologyTrends in Cell Biology, 1992
- Surface pore structures of micro- and ultrafiltration membranes imaged with the atomic force microscopeJournal of Membrane Science, 1992
- Atomic resolution with the atomic force microscope on conductors and nonconductorsJournal of Vacuum Science & Technology A, 1988
- Atomic Force MicroscopePhysical Review Letters, 1986