Influence of depth of information and of resolution in stereologic evaluation of surface electron micrographs
- 1 April 1972
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 95 (2) , 323-336
- https://doi.org/10.1111/j.1365-2818.1972.tb03731.x
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Elektronenmikroskopische Oberflächenabdrücke und ihr AuflösungsvermögenThe Science of Nature, 1966