Determining a maximum value yield of a log using an optical log scanner
- 10 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 747-748
- https://doi.org/10.1109/cvpr.1991.139811
Abstract
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This publication has 1 reference indexed in Scilit:
- Identifying and Locating Surface Defects in Wood: Part of an Automated Lumber Processing SystemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983