1/ f phase noise in quartz s.a.w. devices

10 May 1979

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 15 (10) , 296
https://doi.org/10.1049/el:19790211

Abstract

It has been observed that s.a.w. delay lines made on ST-cut quartz are the major source of 1/f noise in s.a.w. controlled oscillators. However, with proper treatment of the quartz surface, the 1/f noise can be significantly reduced. A modified expression for calculating the single-sideband f.m. noise power spectrum of s.a.w. oscillators is presented.

Keywords

SAW DELAY LINES
QUARTZ SAW DEVICES
ST-CUT QUARTZ
SSB FM NOISE POWER SPECTRUM
1/F PHASE NOISE
SURFACE TREATMENT
SAW CONTROLLED OSCILLATORS

This publication has 2 references indexed in Scilit:

Further Results on UV Cleaning and Ni Electrobonding
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1975
The Molecular Nature of Adsorption on Silica Surfaces
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1973