Invariance in pattern recognition: application to line images
- 28 February 1986
- journal article
- Published by Elsevier in Image and Vision Computing
- Vol. 4 (1) , 11-24
- https://doi.org/10.1016/0262-8856(86)90003-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Low Level Image Segmentation: An Expert SystemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
- Analysis of Line DrawingsPublished by Springer Nature ,1977
- Two Dimensional Unitary TransformsPublished by Springer Nature ,1977
- A method of comparing two patterns independent of possible transformations and small distortionsPattern Recognition, 1972
- On seeing thingsArtificial Intelligence, 1971