Model for quantitative analysis of reflection-electron-energy-loss spectra
- 15 July 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 46 (4) , 2486-2497
- https://doi.org/10.1103/physrevb.46.2486
Abstract
Two models to reproduce experimental inelastic-electron-scattering cross sections determined from reflection-electron-energy-loss spectroscopy (REELS) are considered. The models take into account the momentum transfer in the inelastic processes. Inputs for the models are the dielectric function and the inelastic electron mean free path, which are both taken from previous works. It is found that a model that takes into account the k dependence of the dielectric function and the effect of the field set up by the incoming electron on the outgoing electron gives the best description. Without any adjustable parameters, a reasonable quantitative agreement between experimental and theoretical cross sections is found for Al, Ti, Fe, Cu, Pd, Ag, and Au in a wide energy range (175–10 000 eV). For a backscattered electron, the effective inelastic mean free path is found to depend strongly on the path length. A method to determine the dielectric function from REELS spectra is suggested.Keywords
This publication has 17 references indexed in Scilit:
- Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and PdPhysical Review B, 1991
- Kramers-Krönig analysis of reflection electron energy loss spectra (REELS) of Zr and ZrO2Surface Science, 1990
- Optical properties of metal surfaces from electron energy loss spectroscopy in the reflection modeApplied Surface Science, 1990
- Kramers-Kronig analysis of reflection electron-energy-loss spectra measured with a cylindrical mirror analyzerPhysical Review B, 1989
- Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopyPhysical Review B, 1987
- Inelastic background intensities in XPS spectraSurface Science, 1984
- Reflection electron-energy-loss investigation of the electronic and structural properties of palladiumPhysical Review B, 1984
- Electron excitation and the optical potential in electron microscopyPhilosophical Magazine, 1977
- Characteristic Energy Losses of 8-keV Electrons in Liquid Al, Bi, In, Ga, Hg, and AuPhysical Review B, 1968
- Plasma Losses by Fast Electrons in Thin FilmsPhysical Review B, 1957