New Mechanism For Bipolar Degradation In Sub-micron BiCMOS
- 1 January 1993
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Impact ionization in semiconductors: Effects of high electric fields and high scattering ratesPhysical Review B, 1992
- Avalanche degradation of hFEIEEE Transactions on Electron Devices, 1970
- AMPLIFICATION OF ACOUSTIC SURFACE WAVES WITH ADJACENT SEMICONDUCTOR AND PIEZOELECTRIC CRYSTALSApplied Physics Letters, 1968