Ionization by fast atom bombardment—A chemical lonization (matrix) process in the gas phase?1
- 1 October 1986
- journal article
- research article
- Published by Wiley in Journal of Mass Spectrometry
- Vol. 21 (10) , 707-715
- https://doi.org/10.1002/oms.1210211016
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Ionization in the gas phase with fast atom bombardment. Formation of molecular ionsInternational Journal of Mass Spectrometry and Ion Processes, 1986
- Kinetic energy distributions of organic ions sputtered from solids and liquidsInternational Journal of Mass Spectrometry and Ion Processes, 1985
- Chemical ionization/fast-atom bombardment mass spectrometry: ion/molecule reactionsJournal of the American Chemical Society, 1985
- Matrix compounds for fast atom bombardment mass spectrometryJournal of Mass Spectrometry, 1985
- Evidence for a surface self-cleaning sputtering mechanism in fast atom bombardment mass spectrometryJournal of Mass Spectrometry, 1985
- Investigations on basic aspects of fast atom bombardment mass spectrometry: Matrix effects, sample effects, sensitivity and quantificationJournal of Mass Spectrometry, 1984
- Quantitative behavior of surfactants at the liquid/vacuum interface by secondary ion mass spectrometryInternational Journal of Mass Spectrometry and Ion Processes, 1984
- Fast atom bombardment mass spectrometry (FABMS). A study of surface coverage effects in FABMSJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1983
- Fast atom bombardment of molecules in the gaseous stateInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Particle-induced desorption mass spectrometry of large involatile biomolecules: surface chemistry in the high-energy short-time domainAccounts of Chemical Research, 1982