Critical concentration for metallization of doped germanium and silicon
- 31 July 1976
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 19 (6) , 487-489
- https://doi.org/10.1016/0038-1098(76)90048-x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Metal-to-Nonmetal Transition in-Type Many-Valley SemiconductorsPhysical Review B, 1973
- Metal-to-non-metal transitions in doped germanium and siliconPhilosophical Magazine, 1973
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- Dielectric Screening and the Mott Transition in Many-Valley SemiconductorsPhysical Review B, 1971