Effect of structure development on self-trapped exciton emission of TiO2 thin films

29 November 2000

conference paper
Published by SPIE-Intl Soc Optical Eng

Vol. 4086, 427-431
https://doi.org/10.1117/12.408489

Abstract

Photoluminescence of thin crystalline TiO₂ films was studied. The films contained an anatase phase and were grown by the atomic layer deposition method on different single crystal substrates. A polarized re-combination emission of self-trapped excitons was observed in the films at 5 K. A comparison of the obtained spectra with those of the single crystal anatase allowed determining crystallite orientations in the films. Results were consistent with the x-ray diffraction and reflection high-energy electron diffraction data.

Keywords

REFLECTION
THIN FILM
CRYSTALS
DIFFRACTION
EXCITONS
THIN FILMS
LUMINESCENCE
ATOMIC LAYER DEPOSITION
X RAY DIFFRACTION
ELECTRONS
SINGLE CRYSTAL

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