Magnetostriction mapping of soft magnetic films on thick rigid substrates
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 26 (5) , 2580-2582
- https://doi.org/10.1109/20.104804
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- A new high-precision optical technique to measure magnetostriction of a thin magnetic film deposited on a substrateIEEE Transactions on Magnetics, 1989
- X-ray diffraction studies of thin films and multilayer structuresProgress in Crystal Growth and Characterization, 1989
- Magnetoresistive measurement of magnetostriction in PermalloyIEEE Transactions on Magnetics, 1989
- Easy axis orientation mapping of soft magnetic films using a magneto-optic Kerr BH imagerIEEE Transactions on Magnetics, 1989
- Measurement of thin film's magnetostriction with piezoelectric ceramic substratesIEEE Transactions on Magnetics, 1989