Low Flux Laboratory Test of the Internal Discharge Monitor (IDM) Experiment Intended for Crres

1 January 1985

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 32 (6) , 4065-4072
https://doi.org/10.1109/tns.1985.4334070

Abstract

Twelve planar printed circuit board samples and four cable samples were exposed to a distributed electron source of 150 keV to 2.5 MeV at 4.5 pA/cm2 and were monitored for electron-caused EMP. Discharges were recorded on 10 of the 16 samples during the first 18 hours of testing (total incident fluence equaled 1.8 × 1012 e/cm2).

Keywords

LABORATORIES
TESTING
MONITORING
ELECTRONS
EXTRATERRESTRIAL MEASUREMENTS
SPACE VEHICLES
EMP RADIATION EFFECTS
SPACE TECHNOLOGY
RADIATION EFFECTS
PROPULSION

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