Noncontact surface charge density profiles measurement on top and bottom of a charged film
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Industry Applications
- Vol. 27 (3) , 488-494
- https://doi.org/10.1109/28.81832
Abstract
Equivalent surface charge density profiles on both the top and bottom surfaces of corona-charged films were measured without any contact by using a surface potential voltmeter with a horizontal resolution of about 2 mm and a laser displacement meter with a vertical resolution of 10 mu m. A personal computer controls the sample position with a resolution of a few micrometers, which depends on a digital X-Y stage and a backside ground electrode position (distance from the bottom of the charged film). Surface potential profiles at a few different distances between the ground electrode (back) and the sample film were recorded on a floppy disk, and equivalent surface charge density profiles on the top and the bottom of the film were calculated and plotted automatically by using a personal computer. Some interesting electrostatic phenomena related to their charge behavior are reported as are its applications.Keywords
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