Die Bedeutung des Ionenradius diamagnetischer Kationen für die ESR-Linienbreite von dotierten, antiferromagnetischen Verbindungen
Open Access
- 1 March 1988
- journal article
- Published by Walter de Gruyter GmbH in Zeitschrift für Naturforschung A
- Vol. 43 (3) , 262-270
- https://doi.org/10.1515/zna-1988-0313
Abstract
Polycrystalline samples of diamagnetically doped Cr2O3, still being antiferromagnetic, have been investigated by ESR in their high temperature region. In all mixed crystals of [MxCr1 - x]2O3- type with x < 0.15 a variation of the ESR line width according to ΔB(x) = ΔB(0) [1 - αx] was found. While ΔB decreases with x as expected for M = Al, Ga and Sc, it increases for M = In, Y, Lu, La and Bi. This behaviour cannot be explained by magnetic delution alone. By considering the local distortions in an antiferromagnetic compound caused by incorporated foreign ions, a statistical model is developed that describes the observed ΔB(x) behaviour quantitatively.Keywords
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