Measurement of the dead-layer thickness of a planar intrinsic high-purity germanium detector
- 28 February 1983
- journal article
- Published by Elsevier in The International Journal of Applied Radiation and Isotopes
- Vol. 34 (2) , 519-520
- https://doi.org/10.1016/0020-708x(83)90272-7
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Efficiency of Ge(Li) thin window detectors near absorption edge of germaniumNuclear Instruments and Methods, 1973