Some Phenomena Connected with the Optical Monitoring of Thin-film Deposition, and Their Application to Optical Coatings
- 1 July 1971
- journal article
- research article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 18 (7) , 531-538
- https://doi.org/10.1080/713818471
Abstract
It is shown that a combination of two dielectric layers, each with an optical thickness of less than a quarter-wave, behaves to a great extent as one quarter-wave layer.Keywords
This publication has 1 reference indexed in Scilit:
- Triple-Layer Antireflection Coatings on Glass for the Visible and Near InfraredJournal of the Optical Society of America, 1962