General Metrics For Mixed Features The Cartesian Space Theory For Pattern Recognition

24 August 2005

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 1, 494-497
https://doi.org/10.1109/icsmc.1988.754346

Abstract

General distance functions for mixed feature variables are defined based on the Cartesian space (U/sup (d)/, +,x) which is our new mathematical model for pattern recognition. In our metrics, a sample can be described by a d-tuple which is composed of closed intervals and/or finite sets.

Keywords

PATTERN RECOGNITION
ARGON
MATHEMATICAL MODEL
DATA ANALYSIS
ERBIUM

This publication has 1 reference indexed in Scilit:

Automated Construction of Classifications: Conceptual Clustering Versus Numerical Taxonomy
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1983