The formation of plane-wave X-ray images of microdefects
- 16 January 1985
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 87 (1) , 253-265
- https://doi.org/10.1002/pssa.2210870125
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Topographic representation of micro defects (e.g.`swirls') in nearly perfect crystals. A restricting supplement to an earlier claimJournal of Applied Crystallography, 1981
- Microdefects in silicon different from swirlsPhysica Status Solidi (a), 1979
- IDENTIFICATION OF SMALL DEFECT CLUSTERS IN PARTICLE-IRRADIATED CRYSTALS BY MEANS OF TRANSMISSION ELECTRON MICROSCOPYPublished by Elsevier ,1978
- Topographic observation of micro defects (e.g.`swirls') in nearly perfect crystalsJournal of Applied Crystallography, 1976
- The problem of image formation in X-RAY opticsUspekhi Fizicheskih Nauk, 1972
- New X-Ray Topographic Technique for Detection of Small Defects in Highly Perfect CrystalsJournal of Applied Physics, 1970