XCIII. Some optical properties of evaporated layers of silver, copper and tin
- 1 October 1950
- journal article
- research article
- Published by Taylor & Francis in Journal of Computers in Education
- Vol. 41 (321) , 1018-1031
- https://doi.org/10.1080/14786445008561036
Abstract
In an earlier work (Tolansky 1944), a description was given of the use of multiple-beam interferometry to determine relative phase changes on reflection at the silvered surfaces of an interferometer. This method has been extended and critically examined. It is shown that the method does not approach the accuracy of the older polarimetric methods, and that its optimum use is restricted to reflecting surfaces of fairly high reflection coefficient. Within its limitations the method has advantages.Keywords
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