Measurement of sputtering yields and ion beam damage to organic thin films with the quartz crystal microbalance
- 1 August 1980
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 52 (9) , 1467-1473
- https://doi.org/10.1021/ac50059a020
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: