THE WEAK-BEAM TECHNIQUE AS APPLIED TO DISSOCIATION MEASUREMENTS
- 1 December 1974
- journal article
- Published by EDP Sciences in Le Journal de Physique Colloques
- Vol. 35 (C7) , C7-141
- https://doi.org/10.1051/jphyscol:1974715
Abstract
The application of the weak-beam method of electron microscopy to the measurement of the separation of partial dislocations < 2.0 nm is discussed. The accuracy of the experimental results is analysed, and approximations in obtaining values of the stacking-fault energy, γ, are outlinedKeywords
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