Predicting software's minimum-time-to-hazard and mean-time-to-hazard for rare input events
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Improving the software development process using testability researchPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Faults on its sleevePublished by Association for Computing Machinery (ACM) ,1993
- Operational profiles in software-reliability engineeringIEEE Software, 1993
- Confidently Assessing a Zero Probability of Software FailurePublished by Springer Nature ,1993
- PIE: a dynamic failure-based techniqueIEEE Transactions on Software Engineering, 1992
- Estimating the probability of failure when testing reveals no failuresIEEE Transactions on Software Engineering, 1992