Interconnection effects in fast logic integrated GaAs circuits

27 April 1985

journal article
research article
Published by Taylor & Francis in International Journal of Electronics

Vol. 58 (4) , 671-686
https://doi.org/10.1080/00207218508939061

Abstract

The interconnection lines of fast logic integrated GaAs circuits are analysed using the propagation concepts. The frequential analysis of a single line or coupled lines is done by means of a spectral method adapted to the micronic geometry of the line. We discuss the range of validity of the TEM approximation. The simulation of behaviour of the lines in the time domain is carried out by taking into account the strip losses and the coupling effects. The distortion of the fast transmitted signal is studied and solutions able to improve the transmission of these signals are proposed.

Keywords

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