Reverse bias currents in amorphous silicon nip sensors
- 1 May 1996
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 198-200, 1155-1158
- https://doi.org/10.1016/0022-3093(96)00103-2
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- High electric-field amorphous silicon p-i-n diodes: Effect of the p-layer thicknessJournal of Applied Physics, 1994
- Long-time transient conduction in a-Si:H p─i─n devicesPhilosophical Magazine Part B, 1991
- Amorphous silicon based radiation detectorsJournal of Non-Crystalline Solids, 1991