On the accuracy of orientation determination by selected area electron diffraction
- 1 October 1968
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 18 (154) , 807-816
- https://doi.org/10.1080/14786436808227502
Abstract
A simple, analytical method of calculating unique, accurate orientations from selected area electron diffraction patterns which contain spots or Kikuchi lines from more than one zone is described. The accuracy of the method has been tested experimentally and found to be ±0·1° for Kikuchi patterns and better than ±1° for spot patterns.Keywords
This publication has 10 references indexed in Scilit:
- The uniqueness of orientation determination by selected area electron diffractionPhilosophical Magazine, 1967
- The Orientation and Shape of θ Precipitates Formed in an Al-Cu AlloyPhysica Status Solidi (b), 1967
- Interpretation of Electron Diffraction PatternsPublished by Springer Nature ,1967
- Accuracy in the Use of Electron-Diffraction Spot Patterns for Determining Crystal OrientationsJournal of Applied Physics, 1966
- The nature of dislocation loops in quenched aluminiumPhilosophical Magazine, 1966
- Method for the Precise Determination of Orientation from Electron Diffraction PatternsJournal of Applied Physics, 1965
- The Determination of Orientation from Kikuchi PatternsPhysica Status Solidi (b), 1965
- Applications of Kikuchi Line Analyses in Electron MicroscopyJournal of Applied Physics, 1964
- Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction PatternsPhysica Status Solidi (b), 1964
- On interstitial dislocation loops in aluminium bombarded with alpha-particlesPhilosophical Magazine, 1962