Microscopy and computational modelling to elucidate the enhancement factor for field electron emitters
- 1 August 2001
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 203 (2) , 188-194
- https://doi.org/10.1046/j.1365-2818.2001.00890.x
Abstract
We report on the computation of the electric field at the surface of single‐tip field emitters for a variety of geometries and wide range of geometrical parameters. In conjunction with experimental work, this has allowed the determination of quantities useful for characterizing and comparing the performance of field emitters. The ratio of the field at the tip surface to field at a tip supporting base (enhancement factor) has been calculated for hemispherical tips with parallel or conical shanks, for ratios of tip length to tip radius from 1 to 3000. Enhancement factors greater than 1000 are achievable with suitable tip geometry. The threshold voltage dependence on the tip–anode separation for cylindrical tips facing a flat anode has also been calculated and reported.Keywords
This publication has 5 references indexed in Scilit:
- Field Emission and Electron MicroscopyMicroscopy and Microanalysis, 2000
- Field emitters based on porous aluminum oxide templatesJournal of Applied Physics, 1999
- Unique characteristics of cold cathode carbon-nanotube-matrix field emittersPhysical Review B, 1997
- Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field EmissionMicroscopy Microanalysis Microstructures, 1997
- A Carbon Nanotube Field-Emission Electron SourceScience, 1995