Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission
Open Access
- 1 January 1997
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 8 (6) , 355-368
- https://doi.org/10.1051/mmm:1997127
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of NanotipsAdvances in Imaging and Electron Physics, 1996
- A Carbon Nanotube Field-Emission Electron SourceScience, 1995
- The Cylindrical Envelope Projection Model Applied to SE Images of Curved Surfaces and Comparison with AFM EvaluationsMicroscopy Microanalysis Microstructures, 1995
- Residual pressure effects on SEM/SE YBCO image brightness versus temperatureSuperconductor Science and Technology, 1994
- Contamination in a scanning electron microscope and the influence of specimen coolingScanning, 1994
- On the electron and metallic ion emission from nanotips fabricated by field-surface-melting technique: experiments on W and Au tipsUltramicroscopy, 1992
- Imaging steep, high structures by scanning force microscopy with electron beam deposited tipsSurface Science, 1992
- Point source for ions and electronsPhysica Scripta, 1988
- The contamination of surfaces during high-energy electron irradiationPhilosophical Magazine, 1970