Imaging steep, high structures by scanning force microscopy with electron beam deposited tips
- 1 January 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 268 (1-3) , 333-339
- https://doi.org/10.1016/0039-6028(92)90973-a
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Electromagnetic surface waves on a free-electron-like medium in the presence of a DC current: the dispersion relationSurface Science, 1991
- Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current imagesApplied Physics Letters, 1990
- New scanning tunneling microscopy tip for measuring surface topographyJournal of Vacuum Science & Technology A, 1990
- Direct electron-beam patterning for nanolithographyJournal of Vacuum Science & Technology B, 1989
- Scanned-Probe MicroscopesScientific American, 1989
- I n s i t u observation on electron beam induced chemical vapor deposition by transmission electron microscopyJournal of Vacuum Science & Technology B, 1988
- Imaging of granular high‐Tc thin films using a scanning tunnelling microscope with large scan rangeJournal of Microscopy, 1988
- High-resolution electron-beam induced depositionJournal of Vacuum Science & Technology B, 1988
- Scanning tunneling microscopyJournal of Applied Physics, 1987