Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images
- 27 August 1990
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 57 (9) , 867-869
- https://doi.org/10.1063/1.103390
Abstract
This letter critically discusses the topographical information obtained by scanning tunneling microscopy (STM) on surfaces with a mesoscopic roughness, i.e., in the range of some nm’s. In a foregoing publication [J. Appl. Phys. 67, 1156 (1990)], we already treated the evaluation of constant current images based on the knowledge of the real surface and the shape of the tunneling tip (‘‘tip shape limited resolution’’). Now we deal with the invers problem: the reconstruction of the real surface topography based on the corresponding STM image and the tip shape, using a simple, straightforward formalism.Keywords
This publication has 9 references indexed in Scilit:
- Scanning tunneling microscopy on rough surfaces: Tip-shape-limited resolutionJournal of Applied Physics, 1990
- Tip-related artifacts in scanning tunneling potentiometryPhysical Review B, 1990
- Substrate effects on the surface topography of evaporated gold films—A scanning tunnelling microscopy investigationSurface Science, 1989
- Imaging an optical disc by the combined use of scanning tunnelling microscopy and scanning electron microscopyJournal of Microscopy, 1988
- Imaging of granular high‐Tc thin films using a scanning tunnelling microscope with large scan rangeJournal of Microscopy, 1988
- Apparent barrier height in scanning tunneling microscopyPhysical Review B, 1988
- Tunneling microscopy, lithography, and surface diffusion on an easily prepared, atomically flat gold surfaceJournal of Applied Physics, 1988
- Silver Films Condensed at 300 and 90 K: Scanning Tunneling Microscopy of Their Surface TopographyPhysical Review Letters, 1985
- Theory and Application for the Scanning Tunneling MicroscopePhysical Review Letters, 1983