Accurate microcrystallography using electron back-scattering patterns
- 1 May 1977
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 35 (5) , 1317-1332
- https://doi.org/10.1080/14786437708232955
Abstract
A method for precise determination of the orientation of mierocrystals is described. Electron back-scattering patterns are observed on a fluorescent screen in a scanning electron microscope, and high precision is obtained by casting geo metrical shadows onto the screen to determine the point from which the back-scattered electrons are emitted. Orientational accuracy around ±0.5° can be routinely obtained. The geometrical constructions used for evaluating the crystal orientation, and the errors in this orientation, are described. Some experimental examples are given.Keywords
This publication has 3 references indexed in Scilit:
- Rotation between micrographs from the scanning electron microscope and electron channelling patternsJournal of Physics E: Scientific Instruments, 1974
- Some developments in S.E.M. instrumentationRevue de Physique Appliquée, 1974
- Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscopePhilosophical Magazine, 1973