TEM specimen preparation of individual SiC/C composite (SCS-6) fibers

Publisher Website

1 August 1991

journal article
Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America

Vol. 49, 1104-1105
https://doi.org/10.1017/s0424820100089834

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Chemically Assisted Ion Beam Etching (CAIBE)- a New Technique for TEM Specimen Preparation of Materials
MRS Proceedings, 1990
An application of EELS in the examination of inclusions and grain boundaries of a SiC ceramic
Journal of Microscopy, 1981