Use of tertiarybutylarsine in the metalorganic chemical vapor deposition growth of GaAs
- 2 February 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 50 (5) , 284-286
- https://doi.org/10.1063/1.98226
Abstract
Epitaxial films of GaAs have been grown by metalorganic chemical vapor deposition using a new arsenic source, tertiarybutylarsine (TBAs). Films with excellent surface morphology were obtained for low V/III values over a wide temperature range (600–800 °C), and relatively strong free-exciton emission was observed in the photoluminescence spectra. Hall measurements indicate carrier concentrations as low as 5×1015 cm−3 and mobilities μ300=4000 cm2/V s. These are equivalent or better than results obtained with trimethylarsenic. In contrast to growth with arsine, the layers were found to be n type for all values of V/III ratio investigated (2–20). Higher quality layers can be expected with source repurification of synthesis via a purer chemical process.Keywords
This publication has 17 references indexed in Scilit:
- An integrated laboratory-reactor MOCVD safety systemJournal of Crystal Growth, 1986
- OMCVD growth of GaAs and AlGaAs using a solid as sourceJournal of Electronic Materials, 1985
- Metalorganic chemical-vapour-deposition growth and characterization of GaAsCanadian Journal of Physics, 1985
- Metal organics vapour phase epitaxy of GaAs : Raman studies of complexes formationRevue de Physique Appliquée, 1985
- The growth and characterization of high quality MOVPE GaAs and GaAlAsJournal of Crystal Growth, 1984
- Mechanism of carbon incorporation in MOCVD GaAsJournal of Crystal Growth, 1984
- Correlation between Surface Morphology and Electrical Properties of GaAs Grown by Metalorganic Chemical Vapor DepositionJapanese Journal of Applied Physics, 1984
- High purity GaAs prepared from trimethylgallium and arsineJournal of Crystal Growth, 1981
- Growth of high-purity GaAs epilayers by MOCVD and their applications to microwave MESFET'sJournal of Crystal Growth, 1981
- Improved mobility in OM-VPE-grown Ga
1−
x
In
x
AsElectronics Letters, 1981