Characterisation of the charge density modulation in periodic MOS structures by plasmon spectroscopy
- 1 April 1988
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 3 (4) , 413-417
- https://doi.org/10.1088/0268-1242/3/4/021
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Minigaps in the Plasmon Dispersion of a Two-Dimensional Electron Gas with Spatially Modulated Charge DensityPhysical Review Letters, 1984
- Electronic properties of two-dimensional systemsReviews of Modern Physics, 1982
- Wavevector dependence of the two-dimensional plasmon dispersion relationship in the (100) silicon inversion layerSolid State Communications, 1978
- Observation of the Two-Dimensional Plasmon in Silicon Inversion LayersPhysical Review Letters, 1977