Investigation into the effects of aluminum cathode modification and ion-beam-induced damage in organic light-emitting devices
- 1 September 2004
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 22 (5) , 2511-2517
- https://doi.org/10.1116/1.1800357
Abstract
No abstract availableKeywords
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