Microwave monolithic integrated circuit-related metrology at the National Institute of Standards and Technology
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 39 (6) , 958-961
- https://doi.org/10.1109/19.65805
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Wafer-Level ANA Calibrations at NISTPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- On-Wafer Microwave Standards at NISTPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- On-line accuracy assessment for the dual six-port ANA: Treatment of systematic errorsIEEE Transactions on Instrumentation and Measurement, 1987
- On-line accuracy assessment for the dual six-port ANA: Extension to nonmating connectorsIEEE Transactions on Instrumentation and Measurement, 1987