Low cost testing of high density logic components

Publisher Website

13 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1989.82339

Abstract

No abstract available

Keywords

This publication has 6 references indexed in Scilit:

Fault detection effectiveness of weighted random patterns
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Boundary-scan design principles for efficient LSSD ASIC testing
IBM Journal of Research and Development, 1990
IC quality and test transparency
IEEE Transactions on Industrial Electronics, 1989
A method for generating weighted random test patterns
IBM Journal of Research and Development, 1989
An experimental 80-ns 1-Mbit DRAM with fast page operation
IEEE Journal of Solid-State Circuits, 1985
Low-Cost Testers: Are They Really Low Cost?
IEEE Design & Test of Computers, 1985