Low-angle atomic scattering factors and charge density of aluminum

This publication has 31 references indexed in Scilit:

• An accurate reappraisal of the elemental form factors and charge density of copper
  Acta Crystallographica Section A Foundations of Crystallography, 1990
• Bonding in GaAs
  Physical Review Letters, 1988
• A Summary of Low-angle X-ray Atomic Scattering Factors Measured by the Critical Voltage Effect in High Energy Electron Diffraction
  Australian Journal of Physics, 1988
• The measurement of low-angle structure factors of Cu3Au by high energy electron diffraction
  Philosophical Magazine Part B, 1984
• Diffraction study of the electron density distribution in beryllium metal
  Acta crystallographica Section B, Structural science, crystal engineering and materials, 1984
• Charge-density distribution of Be metal studied byγ-ray diffractometry
  Physical Review B, 1984
• Atomic scattering factors of copper determined by Pendellösung intensity beat measurements using white radiation
  Philosophical Magazine Part B, 1982
• Determination of the Atomic Scattering Factors of Aluminium by the Pendellösung-Beat Measurement Using White Radiation
  Transactions of the Japan Institute of Metals, 1982
• A charge density study of copper by γ-ray diffractometry on imperfect single crystals
  Acta Crystallographica Section A, 1981
• The electron distribution in silicon - I. Experiment
  Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1973