Theoretical Simulation of Atomic Force Microscope Based on Cluster Models

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Abstract
The theoretical simulation of atomic force microscope (AFM) images is performed using a model of a multiple-atom diamond tip scanned on a graphite substrate surface. It is clarified how the AFM images and the force distributions change as the load varies. The effect of the tip apex structure is examined by tilting the tip and by using two different tips. In the cluster models, the interatomic potential within the tip and the surface is assumed to be harmonic, and that between the tip and the surface is taken as Lennard-Jones type. It is clearly shown that AFM images are influenced not only by the geometrical structure of the surface, but also by microscopic elastic properties of the tip and the surface as well as the tip structure.