Determination of breakdown rates and defect densities in SiO2
- 1 May 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 91 (3) , 217-230
- https://doi.org/10.1016/0040-6090(82)90111-0
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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